VLSI Test Symposium (VTS 2004)
Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
ISBN:  

9780769521343


Pages:   550
Publication Date:   01 January 2004
Format:   Paperback
Availability:   Available To Order   Availability explained
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VLSI Test Symposium (VTS 2004)


Overview

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Full Product Details

Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
Imprint:   IEEE Computer Society Press,U.S.
ISBN:  

9780769521343


ISBN 10:   0769521347
Pages:   550
Publication Date:   01 January 2004
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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