VLSI Test Symposium (VTS 2003), 21st IEEE
Author:   IEEE
Publisher:   I.E.E.E.Press
ISBN:  

9780769519241


Pages:   492
Publication Date:   01 January 2003
Format:   Paperback
Availability:   Available To Order   Availability explained
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VLSI Test Symposium (VTS 2003), 21st IEEE


Overview

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Full Product Details

Author:   IEEE
Publisher:   I.E.E.E.Press
Imprint:   I.E.E.E.Press
Weight:   1.043kg
ISBN:  

9780769519241


ISBN 10:   0769519245
Pages:   492
Publication Date:   01 January 2003
Audience:   General/trade ,  College/higher education ,  Professional and scholarly ,  General ,  Undergraduate
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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