Spectral, Photon Counting Computed Tomography: Technology and Applications

Author:   Katsuyuki Taguchi ,  Ira Blevis ,  Krzysztof Iniewski (Redlen Technologies Inc., Canada.)
Publisher:   Taylor & Francis Ltd
ISBN:  

9780367490119


Pages:   422
Publication Date:   01 February 2022
Format:   Paperback
Availability:   In Print   Availability explained
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Spectral, Photon Counting Computed Tomography: Technology and Applications


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Author:   Katsuyuki Taguchi ,  Ira Blevis ,  Krzysztof Iniewski (Redlen Technologies Inc., Canada.)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.811kg
ISBN:  

9780367490119


ISBN 10:   0367490110
Pages:   422
Publication Date:   01 February 2022
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Katsuyuki “Ken” Taguchi, Ph.D. is Professor in The Russell H. Morgan Department of Radiology and Radiological Science, The Johns Hopkins University School of Medicine. He has pioneered and implemented algorithms for prototypes and commercial scanners such as multi-slice CT in 1998, cardiac CT in 2000, and 256-slice CT in 2002. Due to those seminal works and his significant contribution, Dr. Taguchi has received IEEE Nuclear and Plasma Sciences Society 2008 Young Investigator Medical Imaging Science Award. Ira Blevis is Principal Scientist in Philips Healthcare developing semiconductor radiation detectors and Photon Counting CT based on them. Recent progress with the detectors led to a prototype PC scanner based on CZT which served as a basis for an EU H2020 grant awarded to develop a full size prototype for clinical use; Ira served a term as Director of the Philips Project and serves as Philips PI on the Grant. Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a compound semiconductor detector company based in British Columbia, Canada. During his 12 years at Redlen he managed development of highly integrated CZT detector products in medical imaging and security applications.

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