Scan Statistics
Author:   Joseph Glaz ,  Vladimir Pozdnyakov ,  Sylvan Wallenstein
Publisher:   Springer
Edition:   illustrated edition
ISBN:  

9780817672379


Pages:   424
Publication Date:   14 July 2009
Format:   Undefined
Availability:   Out of stock   Availability explained


Our Price $65.87 Quantity:  
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Scan Statistics


Overview

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

Full Product Details

Author:   Joseph Glaz ,  Vladimir Pozdnyakov ,  Sylvan Wallenstein
Publisher:   Springer
Imprint:   Springer
Edition:   illustrated edition
Dimensions:   Width: 25.40cm , Height: 2.20cm , Length: 17.80cm
Weight:   0.730kg
ISBN:  

9780817672379


ISBN 10:   0817672370
Pages:   424
Publication Date:   14 July 2009
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Unknown
Availability:   Out of stock   Availability explained

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