Metrology

Author:   Wei Gao
Publisher:   Springer Verlag, Singapore
Edition:   1st ed. 2019
ISBN:  

9789811049392


Pages:   629
Publication Date:   10 September 2019
Format:   Mixed media product
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Metrology


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Overview

The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements. This volume is part of a handbook series that covers a comprehensive range of scientific and technological matters in 'Precision Manufacturing'.

Full Product Details

Author:   Wei Gao
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   1st ed. 2019
ISBN:  

9789811049392


ISBN 10:   9811049394
Pages:   629
Publication Date:   10 September 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Mixed media product
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Wei Gao received his Bachelor of Precision Instrumentation from Shanghai Jiao Tong University, China, in 1986, followed by MSc and Ph. D from Tohoku University, Japan, in 1991 and 1994, respectively. He is currently a professor and the director of Research Center for Precision Nanosystems, Department of Nanomechanics of Tohoku University. His research interests include precision metrology and micro/nano-metrology. He is a fellow of the International Academy for Production Engineering (CIRP), the International Society for Nanomanufacturing (ISNM), and The Japan Society for Precision Engineering (JSPE). He serves as the Vice-Chairman of The Scientific Technical Committee Precision Engineering and Metrology of CIRP. He is also a Vice President of JSPE in 2015. He works or has worked in the editorial board of several international journals including Precision Engineering, IEEE Transactions on Instrumentation & Measurement, International Journal for Precision Engineering and Manufacturing. He has published more than 150 journal papers and applied more than 50 patents (more than 20 issued). He is the author of the book Precision Nanometrology (Springer) and has won five Paper Awards from JSPE.

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