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Author:   Ron Jenkins (International Centre for Diffraction Data, Newport Square, Pennsylvania) ,  Robert Snyder (New York State College of Ceramics, Alfred University)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Interscience
Volume:   138
Dimensions:   Width: 16.00cm , Height: 2.60cm , Length: 23.40cm
Weight:   0.697kg
ISBN:  

9780471513391

ISBN 10:   0471513393
Pages:   432
Publication Date:   04 September 1996
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Ron Jenkins is General Manager at the International Centre for Diffraction Data in Newtown Square, Pennsylvania. He has been involved in X-ray research for over thirty years and has received several professional awards. Dr. Jenkins is the author of X-ray Fluorescence Spectrometry, An Introduction to X-ray Spectrometry, and six other books, as well as numerous papers and audio courses. He also wrote the section on X-ray technology in Kirk-Othmer Encyclo-pedia of Chemical Technology. Robert L. Snyder is Professor of Ceramic Science at New York State College of Ceramics at Alfred University, and Director of the university's Institute for Ceramic Superconduc-tivity. A Fellow of the American Ceramic Society, Professor Snyder is the author of two previous books and more than 200 published papers. He is active in numerous professional organizations and speaks frequently at conferences.

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