Identification of Defects in Semiconductors

Author:   R. K. Willardson (WILLARDSON CONSULTING SPOKANE, WASHINGTON) ,  Eicke R. Weber (Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany) ,  Michael Stavola (Lehigh University, Bethlehem, Pennsylvania)
Publisher:   Elsevier Science Publishing Co Inc
Volume:   v. 51A
ISBN:  

9780127521596


Pages:   376
Publication Date:   02 July 1998
Format:   Hardback
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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Identification of Defects in Semiconductors


Overview

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.TheWillardson and BeerSeries, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

Full Product Details

Author:   R. K. Willardson (WILLARDSON CONSULTING SPOKANE, WASHINGTON) ,  Eicke R. Weber (Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany) ,  Michael Stavola (Lehigh University, Bethlehem, Pennsylvania)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Volume:   v. 51A
Dimensions:   Width: 15.20cm , Height: 2.50cm , Length: 22.90cm
Weight:   0.800kg
ISBN:  

9780127521596


ISBN 10:   0127521593
Pages:   376
Publication Date:   02 July 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

List of Contributors. Preface. G.D. Watkins, EPR and ENDOR Studies of Defects in Semiconductors. J.M. Spaeth, Magneto-optical and Electrical Detection of Paramagnetic Resonance in Semiconductors. T.A. Kennedy and E.R. Glaser, Magnetic Resonance of Epitaxial Layers Detected by Photoluminescence. K.H. Chow, B.Hitti and R.F. Kiefl, uSR on Muonium in Semiconductors and its Relation to Hydrogen. K.Saarinen, P.Hautojarvi, and C. Corbel, Positron Annihilation Sprectroscopy of Defects in Semiconductors. R. Jones and P.R. Briddon, The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors. Subject Index. Contents of Volumes in This Series.

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Author Information

Prof. Dr. Eicke R. Weber, Fraunhofer-Institut fur Solare Energiesysteme ISE, Freiburg, Germany

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