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OverviewToday's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means meeting the user's needs at a minimum cost. The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. Full Product DetailsAuthor: Michael L Bushnell , Vishwani D AgrawalPublisher: Springer Imprint: Springer ISBN: 9781280206092ISBN 10: 1280206098 Pages: 690 Publication Date: 01 January 2000 Audience: General/trade , General Format: Undefined Publisher's Status: Active Availability: Available To Order We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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