Digital Systems Testing and Testable Design
Author:   Miron Abramovici ,  Melvin A. Breuer ,  Arthur D. Friedman
Publisher:   John Wiley & Sons Inc
Edition:   Revised edition
ISBN:  

9780780310629


Pages:   672
Publication Date:   13 September 1994
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Digital Systems Testing and Testable Design


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Full Product Details

Author:   Miron Abramovici ,  Melvin A. Breuer ,  Arthur D. Friedman
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-IEEE Press
Edition:   Revised edition
Dimensions:   Width: 18.60cm , Height: 4.20cm , Length: 25.80cm
Weight:   1.361kg
ISBN:  

9780780310629


ISBN 10:   0780310624
Pages:   672
Publication Date:   13 September 1994
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Preface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index.

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Author Information

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago. Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles. Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University. All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

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