Design and Test Technology for Dependable Systems-on-Chip
Author:   Raimund Ubar ,  Jaan Raik ,  Heinrich Theodor Vierhaus ,  In Lee
Publisher:   IGI Global
ISBN:  

9781609602123


Pages:   350
Publication Date:   31 March 2011
Format:   Hardback
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

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Design and Test Technology for Dependable Systems-on-Chip


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Full Product Details

Author:   Raimund Ubar ,  Jaan Raik ,  Heinrich Theodor Vierhaus ,  In Lee
Publisher:   IGI Global
Imprint:   IGI Global
Dimensions:   Width: 21.60cm , Height: 3.10cm , Length: 28.00cm
Weight:   1.650kg
ISBN:  

9781609602123


ISBN 10:   1609602129
Pages:   350
Publication Date:   31 March 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

Table of Contents

Built-In Self Repair for Logic Structures Combined Test-Data Compression and Test Planning Diagnostic Modeling of Digital Systems Fault Simulation and Fault Injection Technology Fault-Tolerant and Fail-Safe Design Based on Reconfiguration Flexible Fault-Tolerant Schedules for Embedded Systems Memory Testing and Self-Repair Optimizing Fault Tolerance for Multi-Processor System-on-Chip Software-Based Self-Test of Embedded Microprocessors Transient Faults Detection and Compensation

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