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OverviewThis book covers one of the most important device architectures that have been widely researched to extend the transistor scaling: FinFET. Starting with theory, the book discusses the advantages and the integration challenges of this device architecture. It addresses in detail the topics such as high-density fin patterning, gate stack design, and source/drain engineering, which have been considered challenges for the integration of FinFETs. The book also addresses circuit-related aspects, including the impact of variability on SRAM design, ESD design, and high-T operation. It discusses a new device concept: the junctionless nanowire FET. Full Product DetailsAuthor: Nadine Collaert (IMEC, Leuven, Belgium) , Nadine Collaert (IMEC, Leuven, Belgium)Publisher: Pan Stanford Imprint: Pan Stanford ISBN: 9781322633251ISBN 10: 1322633258 Pages: 444 Publication Date: 01 January 2012 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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