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OverviewFull Product DetailsAuthor: John H. LauPublisher: Kluwer Academic Publishers Group Imprint: Kluwer Academic Publishers Edition: 1994 ed. Dimensions: Width: 15.50cm , Height: 3.10cm , Length: 23.50cm Weight: 2.170kg ISBN: 9780442014414ISBN 10: 0442014414 Pages: 556 Publication Date: 30 June 1994 Audience: College/higher education , General/trade , Undergraduate , General Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPreface; Acknowledgments; A brief introduction to wire bonding, tape automated bonding, and flip chip on board for multichip module applications; Making COB testing tractable: chip pretest and system diagnostics; Chip level interconnect; wire bonding for multichip modules; Chip level interconnect: wafer bumping and inner lead bonding; Chip level interconnect: solder bumped flip chip; Chip attachment; Wire bonding chip on board; Tape automated bonding chip on board and on MCM-D; Solder bumped flip chip attach on SLC board and multichip module; Micron bump bonding chip on board; chip on board encapsulation; Underfill encapsulation for flip chip applications; IndexReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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