Atomic Force Microscopy: A Concise Introduction
Author:   Nancy A Burnham (Worcester Polytechnic Institute, Usa & Eth Zurich, Switzerland)
Publisher:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789819824304


Pages:   250
Publication Date:   13 March 2026
Format:   Paperback
Availability:   Not yet available   Availability explained
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Atomic Force Microscopy: A Concise Introduction


Overview

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Full Product Details

Author:   Nancy A Burnham (Worcester Polytechnic Institute, Usa & Eth Zurich, Switzerland)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789819824304


ISBN 10:   9819824303
Pages:   250
Publication Date:   13 March 2026
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Forthcoming
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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