X-ray Microscopy

Author:   Chris Jacobsen (Argonne National Laboratory, Illinois)
Publisher:   Cambridge University Press
ISBN:  

9781107076570


Pages:   587
Publication Date:   19 December 2019
Format:   Hardback
Availability:   In stock   Availability explained
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X-ray Microscopy


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Overview

Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.

Full Product Details

Author:   Chris Jacobsen (Argonne National Laboratory, Illinois)
Publisher:   Cambridge University Press
Imprint:   Cambridge University Press
Dimensions:   Width: 18.40cm , Height: 3.00cm , Length: 25.40cm
Weight:   1.350kg
ISBN:  

9781107076570


ISBN 10:   1107076579
Pages:   587
Publication Date:   19 December 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Chris Jacobsen is an Argonne Distinguished Fellow at Argonne National Laboratory, Illinois, and a Professor of Physics and Astronomy at Northwestern University, Illinois. He is also a Fellow of the American Association for the Advancement of Science, the American Physical Society, and the Optical Society of America.

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