10th Annual Symposium on Physical and Failure Analysis of Integrated Circuits (Ipfa)
Author:   IEEE
Publisher:   I.E.E.E.Press
Edition:   Illustrated edition
ISBN:  

9780780377226


Pages:   300
Publication Date:   01 January 2003
Format:   Paperback
Availability:   Available To Order   Availability explained
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10th Annual Symposium on Physical and Failure Analysis of Integrated Circuits (Ipfa)


Overview

This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.

Full Product Details

Author:   IEEE
Publisher:   I.E.E.E.Press
Imprint:   I.E.E.E.Press
Edition:   Illustrated edition
ISBN:  

9780780377226


ISBN 10:   0780377222
Pages:   300
Publication Date:   01 January 2003
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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