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OverviewAn up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. Full Product DetailsAuthor: Jinghua Guo (Lawrence Berkeley National Laboratory, Berkeley, USA)Publisher: Not Avail Imprint: Not Avail ISBN: 9786613302403ISBN 10: 6613302406 Pages: 276 Publication Date: 02 August 2011 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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