X-Ray Spectrometry: Recent Technological Advances

Author:   Kouichi Tsuji (Osaka City University, Japan) ,  Jasna Injuk (Micro and Trace Analysis Center, University of Antwerp, Belgium) ,  René Van Grieken (Micro and Trace Analysis Center, University of Antwerp, Belgium)
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471486404


Pages:   624
Publication Date:   12 March 2004
Format:   Hardback
Availability:   Out of stock   Availability explained
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X-Ray Spectrometry: Recent Technological Advances


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Author:   Kouichi Tsuji (Osaka City University, Japan) ,  Jasna Injuk (Micro and Trace Analysis Center, University of Antwerp, Belgium) ,  René Van Grieken (Micro and Trace Analysis Center, University of Antwerp, Belgium)
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 15.20cm , Height: 3.90cm , Length: 22.90cm
Weight:   1.474kg
ISBN:  

9780471486404


ISBN 10:   047148640
Pages:   624
Publication Date:   12 March 2004
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Contributors. Preface. 1 Introduction. 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume. 2 X-Ray Sources. 2.1 Micro X-ray Sources. 2.2 New Synchrotron Radiation Sources. 2.3 Laser-driven X-ray Sources. 3 X-Ray Optics. 3.1 Multilayers for Soft and Hard X-rays. 3.2 Single Capillaries X-ray Optics. 3.3 Polycapillary X-ray Optics. 3.4 Parabolic Compound Refractive X-ray Lenses. 4 X-Ray Detectors. 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy. 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry. 4.3 Superconducting Tunnel Junctions. 4.4 Cryogenic Microcalorimeters. 4.5 Position Sensitive Semiconductor Strip Detectors. 5 Special Configurations. 5.1 Grazing-incidence X-ray Spectrometry. 5.2 Grazing-exit X-ray Spectrometry. 5.3 Portable Equipment for X-ray Fluorescence Analysis. 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis. 5.5 High-energy X-ray Fluorescence. 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy. 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy. 5.8 X-Ray Absorption Techniques. 6 New Computerisation Methods. 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy. 6.2 Spectrum Evaluation. 7 New Applications. 7.1 X-Ray Fluorescence Analysis in Medical Sciences. 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films. 7.3 X-Ray Spectrometry in Archaeometry. 7.4 X-Ray Spectrometry in Forensic Research. 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry. Index.

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Kouichi Tsuji is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. Jasna Injuk is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. René Van Grieken is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley.

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