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OverviewFull Product DetailsAuthor: Kouichi Tsuji (Osaka City University, Japan) , Jasna Injuk (Micro and Trace Analysis Center, University of Antwerp, Belgium) , René Van Grieken (Micro and Trace Analysis Center, University of Antwerp, Belgium)Publisher: John Wiley & Sons Inc Imprint: John Wiley & Sons Inc Dimensions: Width: 15.20cm , Height: 3.90cm , Length: 22.90cm Weight: 1.474kg ISBN: 9780471486404ISBN 10: 047148640 Pages: 624 Publication Date: 12 March 2004 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsContributors. Preface. 1 Introduction. 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume. 2 X-Ray Sources. 2.1 Micro X-ray Sources. 2.2 New Synchrotron Radiation Sources. 2.3 Laser-driven X-ray Sources. 3 X-Ray Optics. 3.1 Multilayers for Soft and Hard X-rays. 3.2 Single Capillaries X-ray Optics. 3.3 Polycapillary X-ray Optics. 3.4 Parabolic Compound Refractive X-ray Lenses. 4 X-Ray Detectors. 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy. 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry. 4.3 Superconducting Tunnel Junctions. 4.4 Cryogenic Microcalorimeters. 4.5 Position Sensitive Semiconductor Strip Detectors. 5 Special Configurations. 5.1 Grazing-incidence X-ray Spectrometry. 5.2 Grazing-exit X-ray Spectrometry. 5.3 Portable Equipment for X-ray Fluorescence Analysis. 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis. 5.5 High-energy X-ray Fluorescence. 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy. 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy. 5.8 X-Ray Absorption Techniques. 6 New Computerisation Methods. 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy. 6.2 Spectrum Evaluation. 7 New Applications. 7.1 X-Ray Fluorescence Analysis in Medical Sciences. 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films. 7.3 X-Ray Spectrometry in Archaeometry. 7.4 X-Ray Spectrometry in Forensic Research. 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry. Index.ReviewsAuthor InformationKouichi Tsuji is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. Jasna Injuk is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. René Van Grieken is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. Tab Content 6Author Website:Countries AvailableAll regions |