X-ray Phase-Contrast Imaging Using Near-Field Speckles

Author:   Marie-Christine Zdora
Publisher:   Springer Nature Switzerland AG
Edition:   1st ed. 2021
ISBN:  

9783030663315


Pages:   337
Publication Date:   18 February 2022
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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X-ray Phase-Contrast Imaging Using Near-Field Speckles


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Overview

This thesis presents research on novel X-ray imaging methods that improve the study of specimens with small density differences, revealing their inner structure and density distribution. Exploiting the phase shift of X-rays in a material can significantly increase the image contrast compared to conventional absorption imaging. This thesis provides a practical guide to X-ray phase-contrast imaging with a strong focus on X-ray speckle-based imaging, the most recently developed phase-sensitive method. X-ray speckle-based imaging only requires a piece of abrasive paper in addition to the standard X-ray imaging setup. Its simplicity and robustness combined with the compatibility with laboratory X-ray sources, make it an ideal candidate for wide user uptake in a range of fields. An in-depth overview of the state of the art of X-ray speckle-based imaging and its latest developments is given in this thesis. It, furthermore, explores a broad range of applications, from X-ray optics characterisation, to biomedical imaging for 3D virtual histology and geological studies of volcanic rocks, demonstrating is promising potential. Moreover, the speckle-based technique is placed in the context of other phase-sensitive X-ray imaging methods to assist in the choice of a suitable method, hence serving as a guide and reference work for future users.

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Author:   Marie-Christine Zdora
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   1st ed. 2021
Weight:   0.551kg
ISBN:  

9783030663315


ISBN 10:   3030663310
Pages:   337
Publication Date:   18 February 2022
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Principles of X-Ray Imaging.- Synchrotron Beamlines, Instrumentation and Contributions.- X-ray Single-Grating Interferometry.- Principles and State of the Art Of X-Ray Speckle-Based Imaging.- The Unified Modulated Pattern Analysis.- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis.- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis.- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging.- Summary, Conclusions and Outlook.- Appendices.

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Author Information

Marie-Christine Zdora has been working on X-ray phase-contrast imaging since 2013. She received her Bachelor of Science and Master of Science in Physics from Technical University Munich in 2011 and 2014, respectively. She, furthermore, holds a Master of Medical Physics from the University of Sydney (2013). In 2015, Marie-Christine moved to Diamond Light Source, where she pursued a PhD in a joint studentship with University College London. In January 2020, she was awarded her PhD in Physics on the topic of X-ray speckle-based phase-contrast imaging from University College London. She is now a postdoctoral research fellow at the University of Southampton.

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