X-Ray Optics and Microanalysis
Author:   Melissa A. Denecke ,  Clive T. Walker
Publisher:   American Institute of Physics
Volume:   v. 1221
ISBN:  

9780735407640


Pages:   228
Publication Date:   12 May 2010
Format:   Hardback
Availability:   In Print   Availability explained
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X-Ray Optics and Microanalysis


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Overview

"""ICXOM Series"" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments."

Full Product Details

Author:   Melissa A. Denecke ,  Clive T. Walker
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 1221
Dimensions:   Width: 21.30cm , Height: 1.80cm , Length: 27.70cm
Weight:   0.726kg
ISBN:  

9780735407640


ISBN 10:   0735407649
Pages:   228
Publication Date:   12 May 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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