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Author:   Stéphane Sebban ,  Julien Gautier ,  David Ros ,  Philippe Zeitoun
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2014
Volume:   147
Weight:   5.444kg
ISBN:  

9783319376097

ISBN 10:   3319376098
Pages:   290
Publication Date:   23 August 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

"Coherent Pulses from Seeded Free-Electron Laser in the Extreme Ultraviolet.- Enhancement of Efficiency of XUV Generation in Atomic Gases Irradiated by Intense Laser Fields.- All-Optical Raman XFEL, Based on the Electron Emission in a Transverse High Intensity Optical Lattice.- Optical Transforms Related to Coherent Imaging of Inclined Objects.- Soft X-Ray Lasing Down to 6.85 nm in Ni-like Samarium.- Fourier Optical Study of Traveling-Wave Excitation at Short-Wavelength Plasma-Lasing.- Coherent Short-Wavelength Plasma Radiation for Lab-Scale Nano-Inspection tools.- Ion Temperature and Cross-Relaxation Effects on OFI Soft-X-Ray Laser.- Study of Particle Correlation Effects on Line Profiles of Ni-Like Collisional XUV Laser Amplification.- The LUNEX5 Project in France.- High Harmonic Generation Driven by Two Quasi-Collinear Pulses.- Real-Time Observation of Laser Heated Metals with High Brightness Monochromatic X-Ray Techniques at Present and Their Future Prospects.- Generation and Application of Coherent Radiation in the Water Window.- Time-Dependent Simulation of Carbon Illuminated by a High Intensity X-Ray Laser.- Regenerative Laser Cavity Tuning for Efficient Soft-X-Ray Laser Operation.- X-Ray Laser Developments at PHELIX.- Parabolic Equation and Exact Transparent Boundary Conditions in X-Ray Optics - Application to Waveguides and Whispering Gallery Optics.- Harmonic Generation and Soft-X-Ray Laser with LASERIX: Souce Development, Applications and Advanced Diagnosis.- Observation of the Laser-Induced Surface Dynamics Using the Single-Shot X-Ray Laser Probe.- Nano-Meter Size Modification of Metal Surfaces Induced by Soft X-Ray Laser Single Pulse.- Speckle Statistics, Coherence and Polarization of a Collisional Soft X-Ray Laser.- Upscaling of X-Ray Laser Repetition of Rate Using an OPCPA Architecture.- Source Development of Novel Coherent X-Rays and Their Applications in JAEA.- Characterization of Zn X-Ray Laser at PALS Centre, Its Application in Dense PlasmaProbing and Astrophysics.- Development of High Reflective Multilayer Mirrors at ""Water Window"" Wavelengths in IPOE.- Time Resolved Holography Scheme Using a Table Top Soft X-Ray Laser.- Plasma Homogenization for Overcoming Refractive Losses in X-Ray Laser.- Temporal Coherence and Spectral Linewidth of Neon-Like XUV Lasers Pumped in the Quasi-Steady State Regime.- Spectral Broadening of Ni-Like XUV Lines.- Visualization of Rapid Dynamic Interactions by Flash Soft X-Ray Microscopy.- Using the X-FEL to Understand X-Ray Thomson Scattering for Partially Ionized Plasmas.- Development of Soft X-Ray Microscopy Using Fresnel Zone Plate for Observation Laser-Induce Surface Dyanmics.- 0.27 GW Soft X-Ray Pulse Using a Plasma-Based Amplification Chain.- Harmonic Generation in Argon by Femtosecond Ti:Sapphire Laser.- Demonstration of a 100 Hz Repetition Rate Soft X-Ray Laser and Gain-Saturated sub-10nm Table-Top.- Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy.- Repetitive XUV Discharge-Pumped Lser at 46.9 nm.- Line-Focus Generation for X-Ray Laser Pumping.- Critical Components for XUV Probing of Laser Driven Shocks.- High Density Optical-Field-Ionization Soft X-Ray Lasers.- Spectral Linewidth Measurement of a Ne-Like Ar Capillary Discharge Soft X-Ray Laser.- Defect Tolerant Talbot Nanopatterning.- Imaging in Nanoscale Using Laser-Plasma Sources of Extreme Ultraviolet (EUV).- Experiments to Diagnose Plasma with a Soft X-Ray Laser Double-Frequency Grating Interferometry.- Heavy-Ion Spectroscopy with X-Ray Lasers at GSI."

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Stéphane Sebban Laboratoire d'Optique Appliquée ENSTA Chemin de la hunière F-91761 Palaiseau Cedex France Julien Gautier Laboratoire d'Optique Appliquée ENSTA Chemin de la hunière F-91761 Palaiseau Cedex France David Ross LPGP, bat. 210 Université Paris-Sud 91405 Orsay France  Philippe Zeitoun Laboratoire d'Optique Appliquée ENSTA Chemin de la hunière F-91761 Palaiseau Cedex France

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