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Author:   C. Suryanarayana ,  M. Grant Norton
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1998
Dimensions:   Width: 15.50cm , Height: 1.50cm , Length: 23.50cm
Weight:   0.444kg
ISBN:  

9781489901507

ISBN 10:   1489901507
Pages:   273
Publication Date:   06 June 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
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Table of Contents

I. Basics.- 1. X-Rays and Diffraction.- 2. Lattices and Crystal Structures.- 3. Practical Aspects of X-Ray Diffraction.- II. Experimental Modules.- Module 1. Crystal Structure Determination. I: Cubic Structures.- Module 2. Crystal Structure Determination. II: Hexagonal Structures.- Module 3. Precise Lattice Parameter Measurements.- Module 4. Phase Diagram Determination.- Module 5. Detection of Long-Range Ordering.- Module 6. Determination of Crystallite Size and Lattice Strain.- Module 7. Quantitative Analysis of Powder Mixtures.- Module 8. Identification of an Unknown Specimen.- Appendixes.- Appendix 1. Plane-Spacing Equations and Unit Cell Volumes.- Appendix 2. Quadratic Forms of Miller Indices for the Cubic System.- Appendix 3. Atomic and Ionic Scattering Factors of Some Selected Elements.- Appendix 4. Summary of Structure Factor Calculations.- Appendix 6. Multiplicity Factors.- Appendix 8. Physical Constants and Conversion Factors.- Appendix 9. JCPDS-ICDD Card Numbers for Some Common Materials.- Appendix 10. Crystal Structures and Lattice Parameters of Some Selected Materials.

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