X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components
Author:   David E. Root ,  Jan Verspecht ,  Jason Horn ,  Mihai Marcu
Publisher:   Cambridge University Press
ISBN:  

9780521193238


Pages:   233
Publication Date:   26 September 2013
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components


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Author:   David E. Root ,  Jan Verspecht ,  Jason Horn ,  Mihai Marcu
Publisher:   Cambridge University Press
Imprint:   Cambridge University Press
Dimensions:   Width: 17.80cm , Height: 1.50cm , Length: 25.20cm
Weight:   0.630kg
ISBN:  

9780521193238


ISBN 10:   0521193230
Pages:   233
Publication Date:   26 September 2013
Audience:   College/higher education ,  Tertiary & Higher Education
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Reviews

'This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters.' Alfy Riddle, IEEE Microwave Magazine


Author Information

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011). Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE. Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements. Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.

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