Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Author:   Sudarshan Bahukudumbi ,  Krishnendu Chakrabarty
Publisher:   Artech House Publishers
Edition:   Unabridged edition
ISBN:  

9781596939899


Pages:   210
Publication Date:   28 February 2010
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Wafer-Level Testing and Test During Burn-In for Integrated Circuits


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Author:   Sudarshan Bahukudumbi ,  Krishnendu Chakrabarty
Publisher:   Artech House Publishers
Imprint:   Artech House Publishers
Edition:   Unabridged edition
Dimensions:   Width: 15.70cm , Height: 1.80cm , Length: 23.10cm
Weight:   0.431kg
ISBN:  

9781596939899


ISBN 10:   1596939893
Pages:   210
Publication Date:   28 February 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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