VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco, Peru, October 6–9, 2019, Revised and Extended Selected Papers

Author:   Carolina Metzler ,  Pierre-Emmanuel Gaillardon ,  Giovanni De Micheli ,  Carlos Silva-Cardenas
Publisher:   Springer Nature Switzerland AG
Edition:   1st ed. 2020
Volume:   586
ISBN:  

9783030532758


Pages:   345
Publication Date:   24 July 2021
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco, Peru, October 6–9, 2019, Revised and Extended Selected Papers


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Overview

This book contains extended and revised versions of the best papers presented at the 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019. The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.

Full Product Details

Author:   Carolina Metzler ,  Pierre-Emmanuel Gaillardon ,  Giovanni De Micheli ,  Carlos Silva-Cardenas
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   1st ed. 2020
Volume:   586
Weight:   0.557kg
ISBN:  

9783030532758


ISBN 10:   3030532755
Pages:   345
Publication Date:   24 July 2021
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Software-Based Self-Test for Delay Faults.- On Test Generation for Microprocessors for Extended Class of Functional Faults.- Robust FinFET Schmitt Trigger Designs for Low Power Applications.- An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.- Process Variability Impact on the SET Response of FinFET Multi-level Design.- Efficient Soft Error Vulnerability Analysis Using Non-Intrusive Fault Injection Techniques.- A Statistical Wafer Scale Error and Redundancy Analysis Simulator.- Hardware-enabled Secure Firmware Updates in Embedded Systems.- Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance.- Security Aspects of Real-time MPSoCs: The Flaws and Opportunities of Preemptive NoCs.- Offset-Compensation Systems for Multi-Gbit/s Optical Receivers.- Accelerating Inference on Binary Neural Networks with Digital RRAM Processing.- Semi- and Fully-Random Access LUTs for Smooth Functions.- A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors.- Exploiting Heterogeneous Mobile Architectures through a Unified Runtime Framework.

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