VLSI Fault Modeling and Testing Techniques
Author:   George W. Zobrist
Publisher:   Bloomsbury Publishing Plc
ISBN:  

9780893917814


Pages:   200
Publication Date:   01 May 1993
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $110.00 Quantity:  
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VLSI Fault Modeling and Testing Techniques


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Full Product Details

Author:   George W. Zobrist
Publisher:   Bloomsbury Publishing Plc
Imprint:   Praeger Publishers Inc
Dimensions:   Width: 16.00cm , Height: 1.70cm , Length: 23.00cm
Weight:   0.450kg
ISBN:  

9780893917814


ISBN 10:   0893917818
Pages:   200
Publication Date:   01 May 1993
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Physical fault modelling and simulation for VLSI MOS circuits; designing CMOS gates to test open faults; testing bridging faults assignment implication constraints an design for testability; testable design synthesis models.

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