VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Author:   Anirban Sengupta ,  Sudeb Dasgupta ,  Virendra Singh ,  Rohit Sharma
Publisher:   Springer Verlag, Singapore
Edition:   1st ed. 2019
Volume:   1066
ISBN:  

9789813297661


Pages:   775
Publication Date:   18 August 2019
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers


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Overview

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Full Product Details

Author:   Anirban Sengupta ,  Sudeb Dasgupta ,  Virendra Singh ,  Rohit Sharma
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   1st ed. 2019
Volume:   1066
Weight:   1.193kg
ISBN:  

9789813297661


ISBN 10:   9813297662
Pages:   775
Publication Date:   18 August 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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