VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author:   S. Rajaram ,  N.B. Balamurugan ,  D. Gracia Nirmala Rani ,  Virendra Singh
Publisher:   Springer Verlag, Singapore
Edition:   2019 ed.
Volume:   892
ISBN:  

9789811359491


Pages:   722
Publication Date:   25 January 2019
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers


Overview

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Full Product Details

Author:   S. Rajaram ,  N.B. Balamurugan ,  D. Gracia Nirmala Rani ,  Virendra Singh
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   2019 ed.
Volume:   892
Weight:   1.116kg
ISBN:  

9789811359491


ISBN 10:   9811359490
Pages:   722
Publication Date:   25 January 2019
Audience:   Professional and scholarly ,  College/higher education ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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