Computer Vision Metrics: Survey, Taxonomy, and Analysis

Author:   Scott Krig
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   1st ed.
ISBN:  

9781430259299


Pages:   508
Publication Date:   30 May 2014
Replaced By:   9783319308999
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Computer Vision Metrics: Survey, Taxonomy, and Analysis


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Overview

Computer Vision Metrics provides an extensive survey and analysis of over 100 current and historical feature description and machine vision methods, with a detailed taxonomy for local, regional and global features. This book provides necessary background to develop intuition about why interest point detectors and feature descriptors actually work, how they are designed, with observations about tuning the methods for achieving robustness and invariance targets for specific applications. The survey is broader than it is deep, with over 540 references provided to dig deeper. The taxonomy includes search methods, spectra components, descriptor representation, shape, distance functions, accuracy, efficiency, robustness and invariance attributes, and more. Rather than providing ‘how-to’ source code examples and shortcuts, this book provides a counterpoint discussion to the many fine opencv community source code resources available for hands-on practitioners.

Full Product Details

Author:   Scott Krig
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   APress
Edition:   1st ed.
Dimensions:   Width: 17.80cm , Height: 2.90cm , Length: 25.40cm
Weight:   7.269kg
ISBN:  

9781430259299


ISBN 10:   1430259299
Pages:   508
Publication Date:   30 May 2014
Audience:   General/trade ,  General
Replaced By:   9783319308999
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Chapter 1. Image Capture and Representation Chapter 2. Image Pre-Processing Chapter 3. Global and Regional Features Chapter 4. Local Feature Design Concepts, Classification, and Learning Chapter 5. Taxonomy Of Feature Description Attributes Chapter 6. Interest Point Detector and Feature Descriptor Survey Chapter 7. Ground Truth Data, Data, Metrics, and Analysis Chapter 8. Vision Pipelines and Optimizations Appendix A. Synthetic Feature Analysis Appendix B. Survey of Ground Truth Datasets Appendix C. Imaging and Computer Vision Resources Appendix D. Extended SDM Metrics

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Author Information

Scott Krig is a pioneer in computer imaging, computer vision, and graphics visualization. He founded Krig Research in 1988 (krigresearch.com), providing the world’s first imaging and vision systems based onhigh-performance engineering workstations, super-computers, and dedicated imaging hardware, serving customers worldwide in 25 countries. Scott has provided imaging and vision solutions around the globe, and has worked closely with many industries, including aerospace, military, intelligence, law enforcement, government research, and academic organizations.More recently, Scott has worked for major corporations and startups serving commercial markets, solving problems in the areas of computer vision, imaging, graphics, visualization, robotics, process control, industrial automation, computer security, cryptography, and consumer applications of imaging and machine vision to PCs, laptops, mobile phones, and tablets. Most recently, Scott provided direction for Intel Corporation in the area of depth-sensing and computer vision methods for embedded systems and mobile platforms.Scott is the author of many patent applications worldwide in the areas of embedded systems, imaging, computer vision, DRM, and computer security, and studied at Stanford.

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