Overview

Techniques of Vacuum Ultraviolet Spectroscopy was first published in 1967. In the three decades since, the techniques associated with vacuum ultraviolet spectroscopy have been greatly expanded. Originally published as two volumes in the serial Experimental Methods in the Physical Sciences, Vacuum Ultraviolet Spectroscopy combines in one paperback volume information on the many advances in vacuum ultraviolet (VUV) research. In addition, the book provides students and researchers with concise reviews of the important aspects of designing experiments in the VUV region. This is the only comprehensive treatise describing the use of synchrotron and other light sources for research, along with the new technologies in optical elements, multilayers, mirror coatings, soft x-ray zone plates, VUV detectors, interferometric spectrometers, and subjects such as spectromicroscopy, lithography, and photon-induced fluorescence. Vacuum Ultraviolet Spectroscopy is an ideal handbook both for the beginner and for the experienced researcher in any field requiring the use of VUV radiation.

Full Product Details

Author:   James A. Samson (University of Nebraska, Lincoln, U.S.A.) ,  David L. Ederer (Tulane University, New Orleans, Louisiana, U.S.A.)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Edition:   New edition
Dimensions:   Width: 15.20cm , Height: 3.50cm , Length: 22.90cm
Weight:   1.200kg
ISBN:  

9780126175608

ISBN 10:   0126175608
Pages:   752
Publication Date:   21 December 2000
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Unknown
Availability:   Out of stock  

Table of Contents

Synchrotron Radiation Sources; Configuration of a Typical Beamline; Glow Discharges and Wall Stabilized Arcs; Hollow Cathode, Penning, and Electron-Beam Excitation Sources; Laser Produced Plasmas; Transition Radiation; Vacuum Ultraviolet Lasers; Radiometric Characterization of VUV Sources; Imaging Properties and Aberrations of Spherical Optics and Nonspherical Optics; Reflectometers; Reflectance Spectra of Single Materials; Polarization; Optical Properties of Materials; Reflecting Optics: Multilayers; Zone Plates; Windows and Filters; Diffraction Gratings; Multilayer Gratings; Crystal Optics; Normal-Incidence Monochromators and Spectrometers; Grazing-Incidence Monochromators for Third-Generation Synchrotron Radiation Sources; Spectographs and Monochromators Using Varied Line Spacing Gratings; Interferometric Spectrometers; Gas Detectors; Photodiode Detectors; Amplifying and Position Sensitive Detectors; Absolute Flux Measurements; Vacuum Techniques; Lithography; X-Ray Spectromicroscopy; Optical Spectroscopy in the VUV Region; Soft X-Ray Fluorescence Spectroscopy

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