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OverviewNowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. Full Product DetailsAuthor: Mahtab NiknahadPublisher: Karlsruher Institut Fur Technologie Imprint: Karlsruher Institut Fur Technologie Dimensions: Width: 17.00cm , Height: 0.90cm , Length: 24.40cm Weight: 0.268kg ISBN: 9783731500384ISBN 10: 3731500388 Pages: 162 Publication Date: 22 May 2014 Audience: General/trade , General Format: Paperback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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