Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Author:   Mahtab Niknahad
Publisher:   Karlsruher Institut Fur Technologie
ISBN:  

9783731500384


Pages:   162
Publication Date:   22 May 2014
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $131.96 Quantity:  
Add to Cart

Share |

Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space


Overview

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

Full Product Details

Author:   Mahtab Niknahad
Publisher:   Karlsruher Institut Fur Technologie
Imprint:   Karlsruher Institut Fur Technologie
Dimensions:   Width: 17.00cm , Height: 0.90cm , Length: 24.40cm
Weight:   0.268kg
ISBN:  

9783731500384


ISBN 10:   3731500388
Pages:   162
Publication Date:   22 May 2014
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

NOV RG 20252

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List