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OverviewOptical fields carry vital diagnostic information, such as amplitude, phase, polarization, spectral, angular and correlation characteristics. The metrology of random optical fields plays an important role in optical diagnostics and optical recognition studies, with applications ranging from astronomy to industrial quality control. This monograph examines the possibilities for diagnostics of light-scattering objects and media by utilizing the properties of coherent optical radiation. Special emphasis is placed on diagnostics of rough surfaces. Ideas formulated in classical work on statistical radiophysics and optics have been adapted to diagnostic application. The text includes techniques and unconventional methods aimed at obtaining the maximum information available. Full Product DetailsAuthor: Oleg V. Angelsky , etc. , Steen G. Hanson , Peter P. MaksimyakPublisher: SPIE Press Imprint: SPIE Press Volume: v. PM 71 Dimensions: Width: 17.80cm , Height: 1.30cm , Length: 25.40cm Weight: 0.333kg ISBN: 9780819434906ISBN 10: 0819434906 Pages: 210 Publication Date: 31 December 1999 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: To order Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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