Understanding Security Issues

Author:   Scott Donaldson ,  Chris Williams ,  Stanley Siegel
Publisher:   De Gruyter
ISBN:  

9781501515231


Pages:   208
Publication Date:   17 December 2018
Format:   Paperback
Availability:   In Print   Availability explained
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Understanding Security Issues


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Overview

With the threats that affect every computer, phone or other device connected to the internet, security has become a responsibility not just for law enforcement authorities or business leaders, but for every individual. Your family, information, property, and business must be protected from cybercriminals in the office, at home, on travel, and in the cloud. Understanding Security Issues provides a solid understanding of the threats, and focuses on useful tips and practices for protecting yourself, all the time, everywhere and anywhere you go. This book discusses security awareness issues and how you can take steps to reduce the risk of becoming a victim: The threats that face every individual and business, all the time. Specific indicators of threats so that you understand when you might be attacked and what to do if they occur. The security mindset and good security practices. Assets that need to be protected at work and at home. Protecting yourself and your business at work. Protecting yourself and your family at home. Protecting yourself and your assets on travel.

Full Product Details

Author:   Scott Donaldson ,  Chris Williams ,  Stanley Siegel
Publisher:   De Gruyter
Imprint:   De|G Press
Weight:   0.351kg
ISBN:  

9781501515231


ISBN 10:   1501515233
Pages:   208
Publication Date:   17 December 2018
Audience:   Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Scott E. Donaldson, Johns Hopkins University, USA; Chris K. Williams, Leidos, USA; Stanley Siegel, Johns Hopkins University, USA

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