Trapped Charged Particles and Fundamental Interactions

Author:   K Blaum ,  F Herfurth
Publisher:   Springer
ISBN:  

9783540870418


Pages:   202
Publication Date:   30 March 2009
Format:   Undefined
Availability:   Out of stock   Availability explained


Our Price $65.87 Quantity:  
Add to Cart

Share |

Trapped Charged Particles and Fundamental Interactions


Add your own review!

Overview

The development of ion traps has spurred significant experimental activities able to link measurable quantities to the most fundamental aspects of physics.

The first chapter sets the scene and motivates the use of ion traps with an in-depth survey of the low-energy electroweak sector of the standard model amenable to precision test. The next parts then introduce and review aspects of the theory, simulation and experimental implementation of such traps. Last but not least, two important applications, namely high resolution mass spectrometry in Penning traps and tests of fundamental physics - such as the CPT theorem - with trapped antiprotons are discussed.

This volume bridges the gap between the graduate textbook and the research literature and will assist graduate students and newcomers to the field in quickly entering and mastering the subject matter.

Full Product Details

Author:   K Blaum ,  F Herfurth
Publisher:   Springer
Imprint:   Springer
Dimensions:   Width: 23.40cm , Height: 1.10cm , Length: 15.60cm
Weight:   0.290kg
ISBN:  

9783540870418


ISBN 10:   3540870415
Pages:   202
Publication Date:   30 March 2009
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Unknown
Availability:   Out of stock   Availability explained

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List