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OverviewThe development of ion traps has spurred significant experimental activities able to link measurable quantities to the most fundamental aspects of physics. The first chapter sets the scene and motivates the use of ion traps with an in-depth survey of the low-energy electroweak sector of the standard model amenable to precision test. The next parts then introduce and review aspects of the theory, simulation and experimental implementation of such traps. Last but not least, two important applications, namely high resolution mass spectrometry in Penning traps and tests of fundamental physics - such as the CPT theorem - with trapped antiprotons are discussed. This volume bridges the gap between the graduate textbook and the research literature and will assist graduate students and newcomers to the field in quickly entering and mastering the subject matter. Full Product DetailsAuthor: K Blaum , F HerfurthPublisher: Springer Imprint: Springer Dimensions: Width: 23.40cm , Height: 1.10cm , Length: 15.60cm Weight: 0.290kg ISBN: 9783540870418ISBN 10: 3540870415 Pages: 202 Publication Date: 30 March 2009 Audience: General/trade , General Format: Undefined Publisher's Status: Unknown Availability: Out of stock ![]() Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |