Transmission Electron Microscopy: Physics of Image Formation and Microanalysis

Author:   L. Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   4th edition
Volume:   v. 36
ISBN:  

9783540625681


Pages:   592
Publication Date:   30 April 1997
Format:   Hardback
Availability:   Out of stock   Availability explained
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis


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Overview

This text presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Full Product Details

Author:   L. Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   4th edition
Volume:   v. 36
Dimensions:   Width: 16.50cm , Height: 3.10cm , Length: 24.10cm
Weight:   0.998kg
ISBN:  

9783540625681


ISBN 10:   3540625682
Pages:   592
Publication Date:   30 April 1997
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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