Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Author:   Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   3rd Revised edition
Volume:   v. 36
ISBN:  

9783540568490


Pages:   545
Publication Date:   29 September 1993
Replaced By:   9783540625681
Format:   Paperback
Availability:   Out of stock   Availability explained
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis


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Overview

This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.

Full Product Details

Author:   Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   3rd Revised edition
Volume:   v. 36
Weight:   0.845kg
ISBN:  

9783540568490


ISBN 10:   3540568492
Pages:   545
Publication Date:   29 September 1993
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Replaced By:   9783540625681
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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