Transient Changes in Molecular Geometries and How to Model Them: Simulating Chemical Reactions of Metal Complexes in Solution to Explore Dynamics, Solvation, Coherence, and the Link to Experiment

Author:   Asmus Ougaard Dohn
Publisher:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2015
ISBN:  

9783319386836


Pages:   146
Publication Date:   17 October 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Transient Changes in Molecular Geometries and How to Model Them: Simulating Chemical Reactions of Metal Complexes in Solution to Explore   Dynamics, Solvation, Coherence, and the Link to Experiment


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Author:   Asmus Ougaard Dohn
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2015
Dimensions:   Width: 15.50cm , Height: 1.00cm , Length: 23.50cm
Weight:   2.876kg
ISBN:  

9783319386836


ISBN 10:   3319386832
Pages:   146
Publication Date:   17 October 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Asmus O. Dohn studied Nano science at the University of Copenhagen, where he focused on structural properties of metallic complexes in solution, analyzed through x-ray and simulation-based methods. He obtained his Masters degree in 2011 with the highest remarks and was awarded the PhD-School Pre-Doc scholarship, for students especially suited for academic careers. He has also worked for the Nano-Science Center on communication/dissemination tasks, both directed towards the general public and for grant applications. His PhD studies included participating in a significant amount of experimental beam times at XFELs and synchrotrons, as well as a stay at the University of Iceland, working on the implementation of more advanced force-fields.

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