Thinning Methodologies For Pattern Recognition
Author:   Ching Yee Suen (Concordia Univ, Canada) ,  Patrick S P Wang (Northeastern Univ, Usa) ,  C.Y. Suen (Concordia University, Canada)
Publisher:   World Scientific Publishing Co Pte Ltd
Volume:   8
ISBN:  

9789810214821


Pages:   352
Publication Date:   01 March 1994
Format:   Hardback
Availability:   Out of stock   Availability explained
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Thinning Methodologies For Pattern Recognition


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Overview

Thinning is a technique widely used in the pre-processing stage of a pattern recognition system to compress data and to enhance feature extraction in the subsequent stage. It reduces a digitized pattern to a skeleton so that all resulting branches are one pixel thick. The method seems easy at first and has many advantages, however after two decades of intensive research, it has been found to be very challenging due to the difficulties in programming computers to do it. This collection of 15 papers by leading scientists working in the area examines the theoretical and experimental aspects of thinning methodologies. The authors have addressed the problems faced, compared their performance results with others and assessed the challenges ahead. Researchers should find the volume helpful in throwing light on difficult issues and stimulating further research in the area.

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Author:   Ching Yee Suen (Concordia Univ, Canada) ,  Patrick S P Wang (Northeastern Univ, Usa) ,  C.Y. Suen (Concordia University, Canada)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   8
ISBN:  

9789810214821


ISBN 10:   9810214820
Pages:   352
Publication Date:   01 March 1994
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

A new thinning algorithm based on controlled deletion of edge regions, G. Dimauro et al; graph-based thinning for binary images, S. Suzuki et al; a parallel thinning algorithm using the bounding boxes techniques, S. Ubeda; invariant thinning, U. Eckhardt & G. Maderlechner; analytical comparison of thinning, Y.Y. Zhang & P.S.P. Wang; methologies for evaluating thinning algorithms for character recognition, R. Plamondon et al; automatic comparison of skeletons by shape matching methods, L. Lam & C.Y. Suen; binary and gray-value skeletons - metrics and algorithms, B.J.H. Verwer et al. (Part contents).

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