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Author:   Young
Publisher:   Oxford University Press
Imprint:   Oxford University Press
Edition:   New edition
Volume:   5
Dimensions:   Width: 15.60cm , Height: 1.80cm , Length: 23.40cm
Weight:   0.459kg
ISBN:  

9780198559122

ISBN 10:   0198559127
Pages:   308
Publication Date:   19 January 1995
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   To order  
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Table of Contents

R.A. Young: Introduction to the Rietveld Method 1: H.M. Rietveld: The early days: a retrospective view 2: E. Prince: Mathematical aspects of Rietveld refinement 3: T.M. Sabine: The flow of radiation in a polycrystalline material 4: R.J. Hill: Data collection strategies: fitting the experiment to the need 5: J.W. Richardson Jr: Background modelling in Rietveld analysis 6: R.L. Snyder: Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis 7: R. Delhez, Th H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and peak shape in the Rietveld method 8: P. Suortti: Bragg reflection profile shape in X-ray powder diffraction patterns 9: C. Bärlocher: Restraints and constraints in Rietveld refinement 10: W.I.F. David, J.D. Jorgensen: Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources 11: R.B. von Dreele: Combined X-ray and neutron Rietveld refinement 12: F. Izumi: Rietveld analysis programs Rietan and Premos and special applications 13: H. Toraya: Position - constrained and unconstrained powder-pattern-decomposition methods 14: A.K. Cheetham: Ab initio structure solutions with powder diffraction data

Reviews

Each of the chapters has its own comprehensive list of references... --Materials Characterization

Each of the chapters has its own comprehensive list of references... --Materials Characterization<br>

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