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OverviewIn this revised and expanded edition, the authors provide a comprehensive overview of the tools, technologies, and physical models needed to understand, build, and analyze microdevices. Students, specialists within the field, and researchers in related fields will appreciate their unified presentation and extensive references. Full Product DetailsAuthor: Ivor Brodie , Julius J. MurayPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 1st ed. Softcover of orig. ed. 1993 Dimensions: Width: 17.00cm , Height: 3.40cm , Length: 24.40cm Weight: 2.530kg ISBN: 9781441932211ISBN 10: 1441932216 Pages: 622 Publication Date: 06 December 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1. Preliminary Survey.- 2. Particle Beams: Sources, Optics, and Interactions.- 3. Plasmas: Physics and Chemistry.- 4. Layering Technologies.- 5. Pattern Generation.- 6. Microcharacterization.- 7. Limits to Nanofabrication.- Appendixes.- Author Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |