Overview

Whether obtained by microscopes, space probes, or the human eye, the same basic tools can be applied to acquire, process, and analyze the data contained in images. Ideal for self study, The Image Processing Handbook, Sixth Edition, first published in 1992, raises the bar once again as the gold-standard reference on this subject. Using extensive new illustrations and diagrams, it offers a logically organized exploration of the important relationship between two-dimensional images and the three-dimensional structures they reveal. Provides Hundreds of Visual Examples in FULL COLOR! The author focuses on helping readers visualize and compare processing and measurement operations and how they are typically combined in fields ranging from microscopy and astronomy to real-world scientific, industrial, and forensic applications. Presenting methods in the order in which they would be applied in a typical workflow--from acquisition to interpretation--this book compares a wide range of algorithms used to: Improve the appearance, printing, and transmission of an image Prepare images for measurement of the features and structures they reveal Isolate objects and structures, and measure their size, shape, color, and position Correct defects and deal with limitations in images Enhance visual content and interpretation of details This handbook avoids dense mathematics, instead using new practical examples that better convey essential principles of image processing. This approach is more useful to develop readers' grasp of how and why to apply processing techniques and ultimately process the mathematical foundations behind them. Much more than just an arbitrary collection of algorithms, this is the rare book that goes beyond mere image improvement, presenting a wide range of powerful example images that illustrate techniques involved in color processing and enhancement. Applying his 50-year experience as a scientist, educator, and industrial consultant, John Russ offers the benefit of his image processing expertise for fields ranging from astronomy and biomedical research to food science and forensics. His valuable insights and guidance continue to make this handbook a must-have reference.

Full Product Details

Author:   John C. Russ (North Carolina State University, Raleigh, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Edition:   6th New edition
Dimensions:   Width: 17.80cm , Height: 4.10cm , Length: 25.40cm
Weight:   2.018kg
ISBN:  

9781439840450

ISBN 10:   1439840458
Pages:   885
Publication Date:   07 April 2011
Audience:   Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Replaced By:   9781498740265
Format:   Hardback
Publisher's Status:   Out of Stock Indefinitely
Availability:   Awaiting stock  

Table of Contents

Acquiring Images Human reliance on images for information Video cameras CCD cameras Camera artifacts and limitations Color cameras Camera resolution CMOS cameras Focusing Electronics and bandwidth limitations Pixels Gray scale resolution Noise High depth images Color imaging Digital camera limitations Color spaces Color correction Color displays Image types Range imaging Multiple images Stereoscopy Imaging requirements Human Vision What we see and why Recognition Technical specs Acuity What the eye tells the brain Spatial comparisons Local to global hierarchies It's about time The third dimension How versus What Seeing what isn't there, and vice versa Image compression A world of light Size matters Shape (whatever that means) Context Arrangements must be made Seeing is believing Printing and Storage Printing Dots on paper Color printing Printing hardware Film recorders Other presentation tools File storage Storage media Magnetic recording Databases for images Browsing and thumbnails Lossless coding Reduced color palettes JPEG compression Wavelet compression Fractal compression Digital movies Correcting Imaging Defects Contrast expansion Noisy images Neighborhood averaging Neighborhood ranking Other neighborhood noise reduction methods Defect removal, maximum entropy and maximum likelihood Nonuniform illumination Fitting a background function Rank leveling Color images Non-planar views Computer graphics Geometric distortion Alignment Interpolation Morphing Image Enhancement in the Spatial Domain Contrast manipulation Histogram equalization Local equalization Laplacian Derivatives Finding edges with gradients More edge detectors Texture Fractal analysis Implementation notes Image math Subtracting images Multiplication and division Principal Components Analysis Other image combinations Processing images in Frequency Space About frequency space The Fourier transform Fourier transforms of simple functions Frequencies and orientations Preferred orientation Texture and fractals Isolating periodic noise Selective masks and filters Selection of periodic information Convolution Deconvolution Noise and Wiener deconvolution Template matching and correlation Autocorrelation Segmentation and Thresholding Thresholding Automatic settings Multiband images Two-dimensional thresholds Multiband thresholding Thresholding from texture Multiple thresholding criteria Textural orientation Region boundaries Conditional histograms Boundary lines Contours Image representation Other segmentation methods The general classification problem Processing Binary Images Boolean operations Combining Boolean operations Masks From pixels to features Boolean logic with features Selecting features by location Double thresholding Erosion and dilation Opening and closing Isotropy Measurements using erosion and dilation Extension to gray scale images Morphology neighborhood parameters Examples of use Euclidean distance map Watershed segmentation Ultimate eroded points Skeletons Boundary lines and thickening Combining skeleton and EDM Global Image Measurements Global measurements and stereology Surface area ASTM Grain Size Multiple types of surfaces Length Thickness Sampling strategies Determining number Curvature, connectivity and the Disector Anisotropy and gradients Size distributions Classical stereology (unfolding) Feature-Specific Measurements Brightness measurements Determining location Orientation Neighbor relationships Alignment Counting Special counting procedures Feature size Circles and ellipses Caliper dimensions Perimeter Characterizing Shape Describing shape Dimensionless ratios Fractal dimension Harmonic analysis Topology Three dimensions Feature Recognition and Classification Template matching and cross-correlation Parametric description Decision points Multidimensional classification Learning systems kNN and cluster analysis Expert systems Neural nets Syntactical models Tomographic Imaging More than two dimensions Volume imaging vs. sections Basics of reconstruction Algebraic reconstruction methods Maximum entropy Defects in reconstructed images Beam hardening Imaging geometries Three-dimensional tomography High resolution tomography 3D Image Visualization Sources of 3D data Serial sections Optical sectioning Sequential removal Stereo measurement 3D data sets Slicing the data set Arbitrary section planes The use of color Volumetric display Stereo viewing Special display hardware Ray tracing Reflection Surfaces Multiply connected surfaces Image processing in 3D Measurements on 3D images Imaging Surfaces Producing surfaces Imaging surfaces by physical contact Noncontacting measurements Microscopy of surfaces Surface composition imaging Processing of range images Processing of composition maps Data presentation and visualization Rendering and visualization Analysis of surface data Profile measurements The Birmingham measurement suite Topographic analysis and fractal dimensions

Reviews

Dr. John C. Russ was the recipient of the 2006 Ernst Abbe Memorial Award of the New York Microscopical Society, for achievements made in the field of microscopy. For more information, visit http://nyms.org

Dr. John C. Russ was the recipient of the 2006 Ernst Abbe Memorial Award of the New York Microscopical Society, for achievements made in the field of microscopy. For more information, visit http://nyms.org

Author Information

Now retired from the Materials Science and Engineering Department at North Carolina State University, Raleigh, USA, Dr. John C. Russ has worked with many different types of microscopes and image analysis tools to study the microstructure of materials. During a career of nearly 50 years teaching students and working in industry, he has become recognized worldwide as an expert in image analysis. He has developed a familiarity with other types of microstructures and corresponding fields, including foods, biological materials, , wood and paper products, textiles, and biomedical and forensic imaging. He has published numerous books and papers, and continues to teach workshops, consult on imaging issues, and provide expert witness testimony. Dr. Russ is the recipient of the Ernst Abbe Memorial Award from the New York Microscopical Society for his achievements in the field of microscopy.

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