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Overview"In ""The gm/ID Methodology, a Sizing Tool for Low-Voltage Analog CMOS Circuits"", we compare the semi-empirical to the compact model approach. Small numbers of parameters make the compact model attractive for the model paves the way towards analytic expressions unaffordable otherwise. The E.K.V model is a good candidate, but when it comes to short channel devices, compact models are either inaccurate or loose straightforwardness. Because sizing requires basically a reliable large signal representation of MOS transistors, we investigate the potential of the E.K.V model when its parameters are supposed to be bias dependent. The model-driven and semi-empirical methods are compared considering the Intrinsic Gain Stage and a few more complex circuits. A series of MATLAB files found on extras-springer.com allow redoing the tests." Full Product DetailsAuthor: Paul JespersPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Previously published in hardcover Dimensions: Width: 15.50cm , Height: 1.00cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781461425052ISBN 10: 1461425050 Pages: 171 Publication Date: 03 May 2012 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsPreface. Notations. Chapter 1. Sizing the Intrinsic Gain Stage. Chapter 2. The Charge Sheet Model revisited. Chapter 3. Graphical interpretation of the Charge Sheet Model. Chapter 4. Compact modeling. Chapter 5. The real transistor. Chapter 6. The real Intrinsic Gain Stage. Chapter 7. The common gate configuration. Chapter 8. Sizing the Miller Op. Amp. Annex 1. How to utilize the C.D. ROM data. Annex 2. The MATLAB toolbox. Annex 3. Temperature and Mismatch, from C.S.M. to E.K.V. Annex 4. E.K.V. intrinsic capacitance models. Bibliography. Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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