The 10th International Conference on X-ray Microscopy
Author:   Ian McNulty ,  Catherine E. Eyberger ,  Barry Lai
Publisher:   American Institute of Physics
Edition:   2011
Volume:   1365
ISBN:  

9780735409255


Pages:   486
Publication Date:   31 October 2011
Format:   Paperback
Availability:   Available To Order   Availability explained
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The 10th International Conference on X-ray Microscopy


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Overview

This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.

Full Product Details

Author:   Ian McNulty ,  Catherine E. Eyberger ,  Barry Lai
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Edition:   2011
Volume:   1365
Dimensions:   Width: 21.30cm , Height: 2.50cm , Length: 27.70cm
Weight:   1.066kg
ISBN:  

9780735409255


ISBN 10:   0735409250
Pages:   486
Publication Date:   31 October 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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