Testing Packaging Reliability and Applications of Semiconductor Lasers-Iv
Author:   Fallahi ,  Kurt J Linden ,  S.C. Wang (National Chiao Tung University, Taiwan, China)
Publisher:   SPIE Press
Volume:   Vol 3626
ISBN:  

9780819430960


Pages:   262
Publication Date:   30 April 1999
Format:   Paperback
Availability:   Uncertain   Availability explained
Stock levels are unknown and need to be verified with the supplier.

Our Price $284.63 Quantity:  
Add to Cart

Share |

Testing Packaging Reliability and Applications of Semiconductor Lasers-Iv


Add your own review!

Overview

Full Product Details

Author:   Fallahi ,  Kurt J Linden ,  S.C. Wang (National Chiao Tung University, Taiwan, China)
Publisher:   SPIE Press
Imprint:   SPIE Press
Volume:   Vol 3626
Weight:   0.635kg
ISBN:  

9780819430960


ISBN 10:   081943096
Pages:   262
Publication Date:   30 April 1999
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Uncertain   Availability explained
Stock levels are unknown and need to be verified with the supplier.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now