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OverviewMany enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the corrective work being performed in a rush and at the last minute. Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing.
Full Product DetailsAuthor: Kim H Pries (Co-Founder, Value Transformation, LLC, Texas, USA Co-Founder, Value Transformation, LLC, Texas, USA Stonebridge Electronics North America, El Paso, Texas, USA) , Jon M Quigley (Co-Founder, Value Transformation, LLC, Texas, USA)Publisher: CRC Press Imprint: CRC Press ISBN: 9781322624136ISBN 10: 1322624135 Pages: 316 Publication Date: 01 January 2010 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |