Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Author:   Takashi Nakamura (Tohoku Univ, Japan) ,  Eishi Ibe (Hitachi Ltd, Japan) ,  Mamoru Baba (Tohoku Univ, Japan) ,  Yasuo Yahagi (Hitachi Ltd, Japan)
Publisher:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789812778819


Pages:   368
Publication Date:   03 April 2008
Format:   Hardback
Availability:   In Print   Availability explained
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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices


Overview

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Full Product Details

Author:   Takashi Nakamura (Tohoku Univ, Japan) ,  Eishi Ibe (Hitachi Ltd, Japan) ,  Mamoru Baba (Tohoku Univ, Japan) ,  Yasuo Yahagi (Hitachi Ltd, Japan)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Dimensions:   Width: 15.50cm , Height: 2.00cm , Length: 23.10cm
Weight:   0.658kg
ISBN:  

9789812778819


ISBN 10:   9812778810
Pages:   368
Publication Date:   03 April 2008
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Terrestrial Neutron Spectrometry and Dosimetry; Irradiation Test in the Terrestrial Field; Neutron Irradiation Test Facilities; Review of Experimental Data and Discussions; Monte Carlo Simulation Methods; Simulation Results and Their Implications; International Standardization of Neutron Test Method; Summary and Challenges.

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