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OverviewThe importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. Written by one of the worlds leading metrologists, this book covers electronics and optics applications as well as mechanical. It is written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia. Full Product DetailsAuthor: David J WhitehousePublisher: Elsevier Science & Technology Imprint: Elsevier Science & Technology ISBN: 9786611073077ISBN 10: 6611073078 Pages: 432 Publication Date: 01 January 2002 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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