Surfaces and Their Measurement

Author:   David J Whitehouse
Publisher:   Elsevier Science & Technology
ISBN:  

9786611073077


Pages:   432
Publication Date:   01 January 2002
Format:   Electronic book text
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Surfaces and Their Measurement


Overview

The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. Written by one of the worlds leading metrologists, this book covers electronics and optics applications as well as mechanical. It is written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia.

Full Product Details

Author:   David J Whitehouse
Publisher:   Elsevier Science & Technology
Imprint:   Elsevier Science & Technology
ISBN:  

9786611073077


ISBN 10:   6611073078
Pages:   432
Publication Date:   01 January 2002
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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