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Overview""Surface Scattering Experiments with Conduction Electrons"" shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methods as demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electron structure of superimposed metal films and superlattices can be elucidated. Full Product DetailsAuthor: Dieter SchumacherPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Volume: v. 128 Weight: 0.295kg ISBN: 9783540561064ISBN 10: 3540561064 Pages: 106 Publication Date: December 1993 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsThe electrical conductivity of thin metal films.- Concepts to describe the surface influence.- Thin metal films on glass supports.- Studies of surface and growth processes.- Final remarks.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |