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Author:   Henning Bubert ,  Holger Jenett
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Wiley-VCH Verlag GmbH
Edition:   illustrated edition
Dimensions:   Width: 18.60cm , Height: 2.20cm , Length: 24.60cm
Weight:   0.812kg
ISBN:  

9783527304585

ISBN 10:   3527304584
Pages:   353
Publication Date:   11 March 2002
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Out of stock  

Table of Contents

Preface.List of Authors.Introduction (J. Riviere & H. Bubert).Electron Detection.Photoelectron Spectroscopy.Auger Electron Spectroscopy (AES) (H. Bubert & J. Riviere).Electron Energy--Loss Spectroscopy (EELS) (R. Schneider).Low--energy Electron Diffraction (LEED) (G. Held).Other Electron--detecting Techniques (J. Riviere).Ion Detection.Static Secondary Ion Mass Spectrometry (SSIMS) (H. Arlinghaus).Dynamic Secondary Ion Mass Spectrometry (SIMS) (H. Hutter).Electron--impact (EI) Secondary Neutral Mass Spectrometry (SNMS) (H. Jenett).Laser--SNMS (H. Arlinghaus).Rutherford Back--scattering Spectroscopy (RBS) (L. Palmetshofer).Low--energy Ion Scattering (LEIS) (P. Bauer).Elastic Recoil Detection Analysis (ERDA) (O. Benka).Nuclear Reaction Analysis (NRA) (O. Benka).Other Ion--detecting Techniques (J. Riviere).Photon Detection.Total Reflection X--ray Fluorescence Analysis (TXRF) (L. Fabry & S. Pahlke).Energy--dispersive X--ray Spectroscopy (EDXS) (R. Schneider).Grazing Incidence X--ray Methods for Near--surface Structural Studies (P. Gibson).Glow Discharge Optical Emission Spectroscopy (GD--OES) (A. Quentmeier).Surface Analysis by Laser Ablation (M. Bolshov).Ion Beam Spectrochemical Analysis (IBSCA) (V. Rupertus).Reflection Absorption IR Spectroscopy (RAIRS) (K. Hinrichs).Surface--enhanced Raman Scattering (SERS) (W. Hill).UV--Vis--IR Ellipsometry (ELL) (B. Gruska & A. Roseler).Other Photon--detecting Techniques (J. Riviere).Scanning Probe Microscopy.Atomic Force Microscopy (AFM) (G. Friedbacher).Scanning Tunneling Microscopy (STM) (G. Friedbacher).Summary and Comparison of Techniques.Surface and Thin Film Analytical Equipment Suppliers.References.Index.

Reviews

...a useful resource... (Journal of the American Chemical Society, Vol. 125, No.26, 2003)

"""...a useful resource..."" (Journal of the American Chemical Society, Vol. 125, No.26, 2003)"

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