Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Author:   Gernot Friedbacher (Vienna University of Technology, Vienna, Austria) ,  Henning Bubert (Institute of Spectrochemistry and Applied Spectroscopy, Dortmund, Germany)
Publisher:   Wiley-VCH Verlag GmbH
Edition:   2nd, Completely Revised and Enlarged Edition
ISBN:  

9783527320479


Pages:   558
Publication Date:   20 April 2011
Format:   Hardback
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications


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Overview

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) ""... a useful resource..."" (Journal of the American Chemical Society)

Full Product Details

Author:   Gernot Friedbacher (Vienna University of Technology, Vienna, Austria) ,  Henning Bubert (Institute of Spectrochemistry and Applied Spectroscopy, Dortmund, Germany)
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Blackwell Verlag GmbH
Edition:   2nd, Completely Revised and Enlarged Edition
Dimensions:   Width: 18.00cm , Height: 3.20cm , Length: 24.90cm
Weight:   1.175kg
ISBN:  

9783527320479


ISBN 10:   3527320474
Pages:   558
Publication Date:   20 April 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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Reviews

...a useful resource... Journal of the American Chemical Society


This book is a handy reference work and contains much useful information for laboratories specializing in one or a few of the techniques; it enables them to compare their methodology with the many other techniques for surface and thin-film analysis. ( Anal Bioanal Chem , 2011) ...a useful resource... Journal of the American Chemical Society


Author Information

Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. His research activities are focused on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis covering a broad field of applications ranging from basic research on thin film systems to materials science. Over the last decades he has held numerous theoretical and practical courses in the field of analytical chemistry with emphasis on intstrumental analysis and surface- and interface analysis. Prof. Friedbacher has published over 120 research articles, reviews, and book chapters. Henning Bubert worked at the Institut für Analytische Wissenschaften - ISAS - (Institute for Analytical Sciences) in Dortmund until his retirement in 2003. He is currently working as guest scientist. His research activities are mainly focused on investigation of surfaces and thin films by electron spectroscopy related to the development and application of new materials in mechanical engineering. He has published over 110 research articles, reviews, and book chapters.

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