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OverviewFull Product DetailsAuthor: Graham C. SmithPublisher: Springer Science+Business Media Imprint: Kluwer Academic/Plenum Publishers Edition: 1994 ed. Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 1.210kg ISBN: 9780306448065ISBN 10: 0306448068 Pages: 156 Publication Date: 30 November 1994 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1. Introduction.- 2. Surface Analysis by Electron Spectroscopy.- 3. Instrumental Techniques for XPS and AES.- 4. Data Processing for AES and XPS.- 5. Quantification of Data from Homogeneous Materials.- 6. Structural Information from Inhomogeneous Samples.- 7. Trends in Surface Analysis.- References.- Selected Abstracts.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |